XRF is an analytical (simultaneous multi-element) method for determining the chemical composition of all kinds of materials. The materials can be in solid, liquid, powder (pressed pallets or fused beads), filtered or other form. This technique can also be used to determine the thickness and composition of layers and coatings.
The method is fast, accurate and non-destructive and usually requires only a minimum of sample preparation. Many samples can be examined with little or no pre-treatment.
Applications are very broad and include (in many fields of science, research and quality control) the metal, cement, oil, polymer and food industries, along with mining, mineralogy and geology, environmental analysis of water and waste materials and pharmacy.
The precision and reproducibility of XRF analysis is very high. Very accurate results are possible when good standard specimens are available but also in applications where no specific standards can be found. The elements that can be analysed range from fluoride to uranium and the concentration range goes from sub-ppm (reliable trace element analysis) levels to 100%. Elements with high atomic numbers have better detection limits than lighter elements.
The system used is a Panalytical AXIOS-Advanced WDXRF (wavelength dispersive) spectrometer fitted with an SST-MAX X-ray source (rhodium target) with a 4kW output and can be operated at 160mA. The AXIOS uses SuperQ software for standard-based analysis and has a standard-less software module called OMNIAN capable of giving the complete composition and quantification of most types of unknown materials. For sample preparation, the laboratory has a variety of sample preparation tools including presses, milling, furnace and fused beam machines.
Some examples of analysis are: